¥ 1594 九五品
库存3件
作者Undefined
出版社Auris Reference Limited
ISBN9781788023726
出版时间2018-04
装帧精装
纸张其他
正文语种英语
上书时间2023-08-04
现货Characterization, Testing, Measurement, and Metrology[9780367275150]
九五品上海
¥ 1787.00
现货Principles of Materials Characterization and Metrology[9780198830252]
九五品上海
¥ 873.00
OPTICAL TESTINC AND METROLOGY
八五品衡水
¥ 50.00
Quantum Metrology and Fundamental
九五品北京
¥ 480.00
现货Quantum Metrology: Foundation of Units and Measurements[9783527412655]
九五品上海
¥ 1693.00
Quantum Metrology,Imaging ,and Communication
九五品周口
¥ 1300.00
Optics in Metrology and Quality Assurance
八品汕头
¥ 25.00
现货Modern Characterization of Electromagnetic Systems and Its Associated Metrology[9781119076469]
九五品上海
¥ 1530.00
Graphene Nanoelectronics Metrology,Synthesis,Properties and Applications
全新南京
¥ 1588.00
Graphene Nanoelectronics Metrology,Synthesis,Properties and Applications
九五品周口
¥ 1500.00
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