现货Characterization, Testing, Measurement, and Metrology[9780367275150]

1787 九五品

仅1件

上海宝山

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作者Prakash, Chander ; Singh, Sunpreet ; Davim, J Paulo

出版社CRC Press

ISBN9780367275150

出版时间2020-10

装帧精装

纸张其他

页数192页

正文语种英语

上书时间2024-03-27

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商品描述: This book presents the broad aspects of measurement, performanceanalysis, and characterization for materials and devices through advanced manufacturing processes. The field of measurement and metrology as a precondition for maintaining high-quality products, devices, and systems in materials and advanced manufacturing process applications has grown substantially in recent years.The focus of this book is to present smart materials in numerous technological sectors such as automotive, bio-manufacturing, chemical, electronics, energy, and construction. Advanced materials have novel properties and therefore must be fully characterized and studied in-depth so they can be incorporated into products that will outperform existing products and resolve current problems.The book captures the emerging areas of materials science and advanced manufacturing engineering and presents recent trends in research for researchers, field engineers, and academic professionals.

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