¥ 500 八五品
仅1件
作者Tauber, Richard N ; Wolf, Stanley
出版社Lattice Press
出版时间2000
装帧精装
货号16-4
上书时间2023-12-26
Characterization in silicon processing
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Characterization in silicon processing
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Characterization in silicon processing
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Characterization in silicon processing
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【特价库存书】Characterization in silicon processing
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SILICON CARBIDE MATERIALS,PROCESSING AND APPLICATIONS IN ELECTRONIC DEVICES
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Defects and Diffusion in Silicon Processing <MRS Proceedings Volume 469>
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Interface studies by second-harmonic generation during silicon-based materials processing
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Defects and Diffusion in Silicon Processing 硅加工中的缺陷和扩散 qhmdsglm
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